DSS-M.03.01 — Edge Micro-Chipping (minor)

Small, bright edge fractures or “nicks” at or just inside the perimeter arris. Under raking light they present as sparkly facets; at higher severities they may form short “chip flanks” pointing into the face. “Micro-chipping” and “chip flank” are defined in VIS terminology and used here strictly as appearance/morphology cues (classification is appearance-only).

• Pinpoint to sub-millimetre chips along the edge/arris; isolated or lightly scattered.
• Bright, faceted reflections in raking views; little to no continuous lineation across the face.
• More visible on dark backdrops; persistence after a Non-Invasive Reveal (clean & dry). Field Identification Cues (Normative)
• Surface-catch class (MSRT): SC-1 (slight) to SC-2 (clear) when the stylus traverses a chip that intrudes onto the exposed face. One light, non-marring pass only per VIS §5.5; do not abrade or “probe.” Prefer a polymer stylus on suspected coated faces.
• Visual signature: Discrete, bright facets at the perimeter; may show tiny chip flanks where depth increases. Lack of continuous lineation distinguishes from scoring/tracks.
• Viewing / lighting: Evaluate at 12 / 36 / 72 in, normal incidence + oblique sweep (~60°-120°) under raking light; surfaces must be clean & dry.
• Location / access: Record pane ID, product family, and surface numbering (#1-#4; laminate-internal if applicable) on forms; acceptance pertains to the exposed surface being evaluated.

• CAT-2 (Light): Small, shallow chips with SC-1 and clean edges, minimal visibility at standard view.
• CAT-3 (Moderate): Clear catch (SC-2) and minor chip flanks; noticeable at standard view.
• CAT-4 (Severe): Pronounced flanks and/or gross edge chipping extending onto the face; pits/craters present.
• CAT-5 (Out of in-place scope): If indicators show the condition is between panes/inaccessible (fixed parallax in IGU) → CAT-5 by location; refer per protocol.

Numeric depth is not required for classification; use MSRT class + morphology. Minor edge micro-chipping that just kisses the face typically reads SC-1 to SC-2 qualitatively (shallow to moderate relief by feel).

• vs. Seamed/arris edge texture (P.03.01): Factory arris shows a uniform frosted band or fine grind lines with SC-0 on the adjacent face and no chip-flank sparkle. Do not conflate with damage.
• vs. Edge grind/polish pattern (P.03.02): Uniform, edge-parallel grind/polish appearance, SC-0 on the face; no bright chip facets.
• vs. Linear scoring (M.01): Scoring forms extended lines across the face with clear catch; micro-chipping appears as discrete edge nicks rather than a continuous track.
• vs. Drill/slot exit lip (P.03.04): Exit lips are confined to hole/slot perimeters as a factory artifact; on the face MSRT reads SC-0 and no chip-flank morphology.

• Photo set (VIS): 12 / 36 / 72 in, normal + oblique; include raking macros of representative chips and at least one context frame showing overall edge continuity.
• MSRT result: Record SC-class (none/slight/clear) with one light, non-marring pass; on coated faces, prefer polymer stylus. Forms: Pane ID; product family & surface numbering; worked surface Y/N; functional coating present on worked surface? (Y/N/Unknown); reveal status; lighting/time; geometry checklist; photos attached. Acceptance split: Acceptance is judged per VIS Section 6 at 12/36/72 in; classification ≠ acceptance. Do not conflate perimeter factory features with face-side acceptance. Reporting Language (Template)

M.03.01 - Edge Micro-Chipping (minor): Discrete, bright micro-chips along the perimeter arris observed under VIS geometry; MSRT on the adjacent face records SC-1/SC-2 at chip locations. No continuous scoring track. Classified CAT-2/CAT-3 by appearance (see notes). Documented with raking macros and VIS forms; acceptance per VIS §6 at 12/36/72 in.